Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

• Blake W. Erickson,
• Séverine Coquoz,
• Jonathan D. Adams,
• Daniel J. Burns and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2012, 3, 747–758, doi:10.3762/bjnano.3.84

• applicable to all channels of AFM data, and can process images in seconds. Keywords: adaptive algorithm; artifact correction; atomic force microscopy; high-speed atomic force microscope; image processing; Introduction Atomic force microscopes (AFMs) are a useful tool for investigating nanoscale surfaces